everlight electronics co., ltd. http://www.ev erlight.com rev.2 page 1 of 6 device no.: cdgt-512-003 prepared date:2005/11/16 prepared by: angel zhang technical data sheet 0.56" triple digit smd displays ELST-512SURWA/s530-a3/s290 features ? packaged in tape and reel for smt manufacturing. ? design flexibility(common cathode or anode). ? categorized for luminous intensity. ? the thickness is thinness than tradition display. ? pb free ? the product itself will remain within rohs compliant version descriptions ? the smd type is much smaller than tradition type components, thus enable smaller board size, higher packing density, reduced storage space and finally smaller equipment to be obtained. applications ? suitable for indoor use. ? audio system. ? set top box. ? game machine. ? channel indicator of tv. device selection guide chip face color material emitted color algainp hyper red gray
everlight electronics co., ltd. http://www.ev erlight.com rev.2 page 2 of 6 device no.: cdgt-512-003 prepared date:2005/11/16 prepared by: angel zhang ELST-512SURWA/s530-a3/s290 package dimensions land pattern(recommend) notes: ? all dimensions are in millimeters, tolerance is 0.25mm unless o therwise noted. ?above specification may be changed without notice. supplier wi ll reserve authority on material change for above specification. absolute maximum ratings (ta=25 ) parameter symbol rating units forward current i f 25 ma pulse forward current *1 i fp 160 ma operating temperature t opr -40 ~ +105 storage temperature t stg -40 ~ +105 reflow temperature t ref 260 electrostatic discharge esd 2000 v power dissipation p d 60 mw reverse voltage v r 5 v notes: *1:i fp conditions--pulse width Q 10msec and duty Q 1/10. *2:reflow time Q 5 seconds.
everlight electronics co., ltd. http://www.ev erlight.com rev.2 page 3 of 6 device no.: cdgt-512-003 prepared date:2005/11/16 prepared by: angel zhang ELST-512SURWA/s530-a3/s290 electro-optical characteristics (ta=25 ) parameter symbol min. typ. max. units condition forward voltage v f -- 2.0 2.4 v i f =20ma reverse current i r -- -- 10 a v r =5v per segment 11.0 21.6 -- luminous intensity per decimal point i v 5.6 9.8 -- mcd i f =10ma peak wavelenght p -- 632 -- nm i f =20ma dominant wavelenght d -- 624 -- nm i f =20ma spectrum radiation bandwidth -- 20 -- nm i f =20ma chromaticity coordinates specifications for bin grading (unit: mcd) rank min. max. rank min. max. r 11.0 17.6 u 30.0 48.0 s 15.0 24.0 v 42.0 67.0 t 21.0 34.0 w 59.0 94.0
everlight electronics co., ltd. http://www.ev erlight.com rev.2 page 4 of 6 device no.: cdgt-512-003 prepared date:2005/11/16 prepared by: angel zhang ELST-512SURWA/s530-a3/s290 typical electro-optical characteristics curves
everlight electronics co., ltd. http://www.ev erlight.com rev.2 page 5 of 6 device no.: cdgt-512-003 prepared date:2005/11/16 prepared by: angel zhang ELST-512SURWA/s530-a3/s290 reflow temp. / time : ! soldering iron : basic spec is Q 5 sec when 260 .if temperature is higher, time should be shorter (+10 -1sec). power dissipation of iron should be smaller than 15 w , and temperature should be controllable. surface temperature of the device should be under 230 . rework : 1. customer must finish rework within 5 sec under 260 . 2. the head of iron can not touch copper foil.
everlight electronics co., ltd. http://www.ev erlight.com rev.2 page 6 of 6 device no.: cdgt-512-003 prepared date:2005/11/16 prepared by: angel zhang ELST-512SURWA/s530-a3/s290 reliability test items and conditions: the reliability of products shall be satisfied with items liste d below. confidence level97% ltpd3% no item test conditions test hours/cycle sample size failure judgment criteria ac/re 1 reflow heat temp:26 0c5c 10 sec 76 pcs 0/1 2 temperature cycle h +10 0c 15min 5min l-40c 15min 300 cycles 76 pcs 0/1 3 thermal shock h +10 0c 5min 10 sec l-10c 5min 300 cycles 76 pcs 0/1 4 high temperature storage temp:10 0c 1000 hrs 76pcs 0/1 5 low temperature storage temp:-4 0c 1000 hrs 76 pcs 0/1 6 dc operating life temp:2 5c if10ma 1000 hrs 76 pcs 0/1 7 high temperature / high humidity 8 5c / 85% rh 1000 hrs 76 pcs ivQivt*0.5 or vfRu or vfQl 0/1 noteivtthe test iv value of the chip before the reliablility test ivthe test value of the chip that has completed the reliablili ty test uupper specification limit l lower specification limit
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